TRANSMISSION LOSSES IN INTEGRATED SILICON WAVEGUIDES AND METHODS OF THEIR EXPERIMENTAL DEFINITION

Authors

  • Андрій Романович Варцаб'юк PreCarpathian National University by V. Stefanic

Keywords:

silicon waveguide, optic losses, experimental technique, surface roughness.

Abstract

In article the analysis of transmision losses in polysilicon waveguide have been carried out, methods by means of which characteristics of waveguides can be improved are given. Methods of experimental definition of optical losses in waveguides are considered.

References

1. Black Marcie. Loss in polysilicon waveguides. Master's thesis, MIT, 1995.
2. Lee K. K., Lim D. R., Luan H-C, Agarwal A., Foresi J. S. and Kimerling L. C. The effect of size and roughness on light transmision in a si/sio2 waveguide: Experiments and model. Submitted to App. Phys. Lett., 2000.
3. Liao Ling. Low loss polysilicon waveguides for silicon photonics. Master's thesis, MIT, 1997.
4. Tien P.K.. Light waves in thin films and integrated optics. Aplied Optics, 10(11):2395, 1971.

Published

2019-03-08

How to Cite

Варцаб’юк, А. Р. (2019). TRANSMISSION LOSSES IN INTEGRATED SILICON WAVEGUIDES AND METHODS OF THEIR EXPERIMENTAL DEFINITION. PRECARPATHIAN BULLETIN OF THE SHEVCHENKO SCIENTIFIC SOCIETY. Number, (1(1), 191–196. Retrieved from https://pvntsh.nung.edu.ua/index.php/number/article/view/351