НОВОСЯДЛИЙ, Степан Петрович; ФРИК, Ольга Богданівна. ELECTROPHYSICAL DIAGNOSIS OF THE LARGE SCALE INTEGRATION SUBMICRON STRUCTURES RELIABILITY BASED ON THE EFFECTS OF THE NONLINEARITY OF THEIR CHARACTERISTICS. PRECARPATHIAN BULLETIN OF THE SHEVCHENKO SCIENTIFIC SOCIETY. Number, [S. l.], n. 1(1), p. 182–190, 2019. Disponível em: https://pvntsh.nung.edu.ua/index.php/number/article/view/350. Acesso em: 11 apr. 2025.