ГАЛУЩАК, Мар’ян Олексійович. MECHANISMS OF DEFECTMAKING IN SEMICONDUCTOR TAPES OF HALCOGEN LEAD AND TIN. PRECARPATHIAN BULLETIN OF THE SHEVCHENKO SCIENTIFIC SOCIETY. Number, [S. l.], n. 1(1), p. 112–140, 2019. Disponível em: https://pvntsh.nung.edu.ua/index.php/number/article/view/345. Acesso em: 11 apr. 2025.